wafer prober meaning in Chinese

晶片检测器
晶片检测仪
晶片探测器
晶圆探测器

One of the most important advancements recently for electroglas has been in gaining greater control over the z direction of the wafer prober , which affects the accuracy and impact force of touchdowns on wafers and enables their customers to effectively test even the most recent types of delicate devices
其中伊智公司最近最重要的一个进步就是：实现了对于晶圆探针台z方向的更大程度的控制，这直接影响到探针接触晶圆的精确性和冲击力，为客户提供了高效率的测试；即使是最新型的精细器件。